Jessica Riesterer lab
Credit: OHSU News
The instrument shown is the Thermo Scientific Helios UC5 DualBeam Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) at OHSU’s Multiscale Microscopy Core and used by Jessica Riesterer, Ph.D., a staff scientist with CEDAR. Riesterer is an expert on scanning electron microscopy, a technique that uses a focused beam of electrons to examine the surface of a material and produce high-resolution images. (OHSU/Christine Torres Hicks)